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A Comment on AFM vs. Replicas for High Resolution Imaging
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- Journal:
- Microscopy Today / Volume 14 / Issue 3 / May 2006
- Published online by Cambridge University Press:
- 14 March 2018, p. 50
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- May 2006
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X-ray Analysis in the Low Vacuum SEM (Part 3 of 3)
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- Journal:
- Microscopy Today / Volume 6 / Issue 10 / December 1998
- Published online by Cambridge University Press:
- 14 March 2018, pp. 10-13
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- December 1998
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The Effect of Gas Type on Beam Scatter: X-ray Analysis in the Low Vacuum SEM (Part 2 of 3)
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- Microscopy Today / Volume 6 / Issue 7 / September 1998
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- 14 March 2018, pp. 12-13
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- September 1998
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X-Ray Analysis in a Vacuum?
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- Microscopy Today / Volume 5 / Issue 6 / August 1997
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- 14 March 2018, pp. 32-35
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- August 1997
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X-Ray Detectors: Present and Future
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- Microscopy Today / Volume 4 / Issue 3 / April 1996
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-9
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- April 1996
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Environmental SEMs: A New Way to Look at Samples
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- Journal:
- Microscopy Today / Volume 3 / Issue 8 / October 1995
- Published online by Cambridge University Press:
- 14 March 2018, pp. 14-15
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- October 1995
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More Sample Preparation for SEM and X-ray Microanalysis
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- Journal:
- Microscopy Today / Volume 3 / Issue 6 / August 1995
- Published online by Cambridge University Press:
- 14 March 2018, p. 30
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- August 1995
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Sample Preparation for X-Ray Microanalysis
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- Journal:
- Microscopy Today / Volume 3 / Issue 5 / June 1995
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-8
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- June 1995
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The Application of Monte Carlo Modeling to X-Ray Microanalysis
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- Microscopy Today / Volume 2 / Issue 6 / September 1994
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-9
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- September 1994
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Atomic Force Microscopy A Practical Tool for Problem Solving
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- Journal:
- Microscopy Today / Volume 0 / Issue 8 / November 1992
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-8
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- November 1992
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